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Reference #:
2007-132
Inventors/Contributors
Dan J. Schraufnagel, Robert W. Techentin, Bart O. McCoy, Wayne Fjerstad, Shaun Schreiber, Steven Schuster, Patrick Zabinski, Stephen Polzer
Description
The test system will automate multi-port VNA S-parameters measurements of printed wiring boards (PWB). The information gathered is automatically evaluated against complex pass/fail criteria and used to grade the signal integrity quality of PWBs.
Patent Status
None |
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Contact
Bruce R. Kline, Licensing Manager
kline.bruce1@mayo.edu
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Mayo Foundation for Medical Education and Research
Office of Technology Commercialization
MN BioBusiness Center
200 First Street SW
Rochester, MN 55905
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Phone: (507) 266-4586
Fax: (507) 284-5410
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